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6" Wafers |
| Item |
Qty in |
Material |
Orient. |
Diam. |
Thck |
Surf. |
Resistivity |
Comment |
| Stock |
(μm) |
Ωcm |
| 6898 |
10 |
p-type Si:B |
[111] ±0.5° |
6" |
1,000 |
SSP |
FZ >5,000 |
SEMI Prime, 1Flat (57.5mm), Empak cst |
| B208 |
1 |
n-type Si:P |
[100] ±1° |
6" |
1,000 ±50 |
DSP |
FZ >9,500 |
SEMI Prime, 1Flat (57.5mm), Empak cst, Lifetime>6,000μs |
| S5622 |
14 |
n-type Si:P |
[100] |
6" |
1,300 ±10 |
E/E |
FZ 0.01-0.05 |
SEMI notch, Empak cst |
| L405 |
4 |
p-type Si:B |
[100] |
6" |
1,000 |
DSP |
10-15 |
SEMI Prime, 1Flat (57.5mm), Empak cst, 4 Prime wafers plus 2 scratched wafers at no cost |
| 7030 |
75 |
p-type Si:B |
[100] |
6" |
1,000 |
SSP |
5-10 |
SEMI Prime, 1Flat (57.5mm), Empak cst |
| F162 |
4 |
p-type Si:B |
[100] |
6" |
2,000 ±50 |
DSP |
1-35 |
SEMI Prime, 1Flat (57.5mm), Individual cst, Group of 4 wafers |
| E162 |
2 |
p-type Si:B |
[100] |
6" |
2,000 ±50 |
SSP |
1-35 |
SEMI Prime, 1Flat (57.5mm), Group of 2 wafers, Back-Side polished with small scratches |
| G515 |
1 |
p-type Si:B |
[100] |
6" |
2,200 |
DSP |
1-100 |
SEMI Prime, 1Flat (57.5mm), Individual cst, TTV<1μm |
| 7856 |
10 |
p-type Si:B |
[100] |
6" |
3,000 ±50 |
SSP |
1-100 |
SEMI Prime, 1Flat (57.5mm), Individual cst |
| F253 |
2 |
p-type Si:B |
[100] |
6" |
1,500 |
DSP |
0.01-0.02 |
SEMI Prime, 1Flat (57.5mm), Empak cst, TTV<5μm |
| 7314 |
2 |
n-type Si:P |
[100] |
6" |
1,280 |
DSP |
10-35 |
SEMI notch Prime, Empak cst |
| F089 |
4 |
n-type Si:P |
[100] |
6" |
1,910 ±10 |
DSP |
1-100 |
SEMI Prime, 1Flat (57.5mm), TTV<5μm, sealed in stacked trays of 1 + 3 wafer |
| H631 |
7 |
n-type Si:P |
[100] |
6" |
1,910 ±10 |
DSP |
1-100 |
SEMI Prime, 1Flat (57.5mm), hard cst, TTV<3μm |
| G844 |
3 |
n-type Si:P |
[100] |
6" |
5,000 |
DSP |
1-35 |
SEMI Prime, 1Flat (57.5mm), Individual cst |
| 2533 |
2 |
n-type Si:As |
[100] |
6" |
1,000 |
L/L |
0.0033-0.0037 |
SEMI, 1Flat(57.5mm), in individual wafer cassettes |
| E533 |
1 |
n-type Si:As |
[100] |
6" |
1,000 |
L/L |
0.0033-0.0037 |
SEMI, 1Flat(57.5mm), in individual wafer cassettes |
| C316 |
10 |
n-type Si:P |
[911] ±0.5° |
6" |
1,500 |
G/G |
0.1-35.0 |
Prime, 1Flat, Empak cst |
| P406 |
5 |
n-type Si:P |
[411] ±1° |
6" |
1,000 |
SSP |
1-100 |
SEMI Prime, 1Flat (57.5mm), Empak cst, TTV<5μm |
| H515 |
15 |
p-type Si:B |
[100] |
6" |
2,200 |
DSP |
1-100 |
SEMI Prime, 1Flat (57.5mm), Individual cst, TTV<1μm |
| G089 |
5 |
n-type Si:P |
[100] |
6" |
1,875 |
DSP |
1-100 |
SEMI Prime, 1Flat (57.5mm), TTV<3μm, in stacked trays of 5 wafers |
5" Wafers |
| S5907 |
20 |
p-type Si:B |
[100] |
5" |
1,010 ±15 |
SSP |
FZ >1,000 |
SEMI Prime, 1Flat, Empak cst, TTV<5μm |
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4" Wafers |
| Item |
Qty in |
Material |
Orient. |
Diam. |
Thck |
Surf. |
Resistivity |
Comment |
| Stock |
(μm) |
Ωcm |
| J178 |
1 |
p-type Si:B |
[100] |
4" |
1,000 |
DSP |
FZ >1,500 |
SEMI Prime, 2Flats, Empak cst |
| 7582c |
2 |
p-type Si:B |
[100] |
4" |
1,000 |
DSP |
FZ >1,000 |
SEMI Prime, 2Flats, Empak cst, TTV<1μm |
| D523 |
5 |
n-type Si:P |
[111] ±0.5° |
4" |
1,000 |
DSP |
FZ 0.011-0.013 |
Prime, NO Flats, Empak cst |
| 6847 |
40 |
Intrinsic Si:- |
[100] |
4" |
1,000 |
DSP |
FZ >20,000 |
SEMI Prime, 1Flat, Empak cst |
| L847 |
3 |
Intrinsic Si:- |
[100] |
4" |
1,000 |
DSP |
FZ >20,000 |
SEMI Prime, 1Flat, Empak cst |
| H629 |
4 |
Intrinsic Si:- |
[100] |
4" |
1,500 |
DSP |
FZ >20,000 |
Prime, NO Flats, Empak cst |
| F422 |
2 |
Intrinsic Si:- |
[100] |
4" |
3,000 ±50 |
DSP |
FZ >20,000 |
SEMI Prime, 1Flat, Individual cst |
| E608 |
4 |
Intrinsic Si:- |
[111-8° towards[110]] ±0.5° |
4" |
1,000 |
DSP |
FZ 20,000-30,000 |
SEMI Prime, 1Flat, Empak cst, TTV<5μm |
| H775 |
11 |
p-type Si:B |
[110] ±0.5° |
4" |
1,650 |
SSP |
10-15 |
SEMI Prime, 1Flat, Individual cst |
| 7155 |
42 |
p-type Si:B |
[100] |
4" |
1,000 |
DSP |
10-20 |
SEMI Prime, 2Flats, Empak cst, TTV<5μm |
| 7290 |
50 |
p-type Si:B |
[100] |
4" |
1,000 |
DSP |
10-20 |
SEMI Prime, 2Flats, Empak cst, TTV<5μm |
| 7791 |
250 |
p-type Si:B |
[100] |
4" |
1,000 |
DSP |
10-20 |
SEMI Prime, 2Flats, Empak cst, TTV<5μm |
| F153 |
6 |
p-type Si:B |
[100] |
4" |
3,000 |
DSP |
10-15 |
SEMI Prime, 1Flat, Individual cst |
| F986 |
15 |
p-type Si:B |
[100] |
4" |
1,600 |
DSP |
~6 |
SEMI Prime, 1Flat, Individual cst |
| 6938 |
35 |
p-type Si:B |
[100] |
4" |
1,000 |
SSP |
5-10 |
SEMI Prime, 1Flat, Empak cst, TTV<5μm |
| 7520 |
400 |
p-type Si:B |
[100] |
4" |
1,000 |
SSP |
5-10 |
SEMI Prime, 1Flat, Empak cst, TTV<5μm |
| M520 |
25 |
p-type Si:B |
[100] |
4" |
1,000 |
SSP |
5-10 |
SEMI Prime, 1Flat, Empak cst, TTV<5μm |
| S1020 |
2 |
p-type Si:B |
[100] |
4" |
1,000 |
SSP |
>1 |
SEMI Test, Scratched could be reworked for extra fee |
| 6347 |
13 |
p-type Si:B |
[100] |
4" |
1,200 |
DSP |
1-15 |
SEMI Prime, 2Flats, Empak cst |
| 7699 |
25 |
p-type Si:B |
[100] |
4" |
1,400 |
DSP |
1-10 |
SEMI Prime, 1Flat, Empak cst |
| 7070 |
15 |
p-type Si:B |
[100] |
4" |
1,500 |
DSP |
1-10 |
SEMI Prime, 2Flats, Empak cst, TTV<5μm |
| 7654 |
5 |
p-type Si:B |
[100] |
4" |
2,000 ±50 |
SSP |
1-100 |
Prime, NO Flats, Individual cst |
| 6521 |
10 |
p-type Si:B |
[100] |
4" |
2,100 |
SSP |
1-100 |
SEMI Prime, 1Flat, Individual cst, Manual Edges, Groups of 10 + 10 wafers |
| 7103 |
22 |
p-type Si:B |
[100] |
4" |
3,000 |
SSP |
1-30 |
SEMI, 2Flats, Empak cst, Groups of 5 wafers |
| 7565 |
8 |
p-type Si:B |
[100] |
4" |
3,000 |
SSP |
1-30 |
SEMI Prime, 2Flats, Individual cst |
| D594 |
5 |
p-type Si:B |
[100] |
4" |
3,175 ±35 |
DSP |
1-10 |
SEMI Prime, 2Flats, Individual cst, TTV<8μm |
| G134 |
8 |
p-type Si:B |
[100] |
4" |
1,000 ±50 |
DSP |
0.001-0.005 |
Prime, NO Flats, Empak cst |
| 7840 |
3 |
p-type Si:B |
[100] |
4" |
5,000 ±100 |
SSP |
0.001-0.010 |
Prime, NO Flats, Individual cst |
| M620 |
7 |
p-type Si:B |
[111] |
4" |
1,000 |
DSP |
1-10 |
SEMI Prime, 1Flat, Empak cst |
| D599 |
5 |
p-type Si:B |
[111] ±0.5° |
4" |
1,000 |
DSP |
0.001-0.005 |
SEMI Prime, 1Flat, Empak cst |
| 4949 |
25 |
p-type Si:B |
[111] ±0.5° |
4" |
1,000 |
SSP |
<0.01 |
SEMI Prime, 1Flat, Empak cst |
| E153 |
3 |
n-type Si:P |
[100] |
4" |
2,500 |
DSP |
1-100 |
SEMI Prime, 2Flats, Individual cst, Group of 3 wafers |
| S5932 |
1 |
n-type Si:P |
[100] |
4" |
20,000 ±100 |
SSP |
1-10 |
Test, NO Flats, Individual cst, Unsealed defective |
| 4975 |
13 |
n-type Si:Sb |
[211] ±0.5° |
4" |
1,500 ±15 |
DSP |
0.01-0.02 |
SEMI Prime, 1Flat, Empak cst, TTV<1μm |
| F975 |
4 |
n-type Si:Sb |
[211] ±0.5° |
4" |
1,600 ±100 |
C/C |
0.01-0.02 |
SEMI Test, 1Flat, Empak cst, Wafers can be polished for additional fee |
| E395 |
10 |
n-type Si:P |
[111] |
4" |
1,200 |
DSP |
35-85 |
SEMI Prime, 2Flats, Empak cst |
| 7430 |
23 |
n-type Si:P |
[111] |
4" |
1,000 |
SSP |
1-10 |
SEMI Prime, 2Flats, Empak cst |
| F677 |
7 |
n-type Si:P |
[111] ±0.5° |
4" |
1,000 |
SSP |
1-10 |
SEMI Prime, 2Flats, Empak cst |
| TS017 |
43 |
n-type Si:P |
[111] ±1° |
4" |
1,143 ±50 |
DSP |
1-100 {2.9-46.5} |
SEMI Prime, 2Flats, TTV<3μm, Empak cst (9+15+19 wafers) |
| 7459 |
5 |
n-type Si:P |
[111] ±0.5° |
4" |
2,000 ±50 |
E/E |
1-10 |
Prime, NO Flats, Edges: beveled, Individual cst |
| 7529 |
3 |
n-type Si:P |
[111] ±0.5° |
4" |
6,000 |
SSP |
1-30 |
Prime, 2Flats (90°), Individual cst |
| 3556 |
87 |
n-type Si:As |
[111] ±0.5° |
4" |
1,000 |
SSP |
0.001-0.005 {0.0031-0.0040} |
SEMI Prime, 2Flats, Empak cst, TTV<4μm, Bow<10μm, Warp<20μm |
3" Wafers |
| Item |
Qty in |
Material |
Orient. |
Diam. |
Thck |
Surf. |
Resistivity |
Comment |
| Stock |
(μm) |
Ωcm |
| H138 |
10 |
n-type Si:P |
[100] |
3" |
6,000 ±50 |
DSP |
FZ >5,000 |
Prime, NO Flats, Individual cst |
| 5754 |
9 |
n-type Si:P |
[211] ±0.5° |
3" |
1,016 |
DSP |
FZ 25-75 |
Prime, 1Flat, Empak cst |
| 5759 |
20 |
n-type Si:P |
[211] ±0.5° |
3" |
1,016 |
DSP |
FZ 25-75 |
Prime, 1Flat, Empak cst |
| 5760 |
25 |
n-type Si:P |
[211] ±0.5° |
3" |
1,016 |
DSP |
FZ 25-75 |
SEMI TEST, 1Flat, Empak cst |
| 3273 |
50 |
n-type Si:P |
[111] ±0.5° |
3" |
1,000 |
SSP |
FZ >5,000 |
SEMI Prime, 2Flats, Empak cst |
| G504 |
5 |
Intrinsic Si:- |
[100] |
3" |
1,000 |
DSP |
FZ >20,000 |
SEMI, 1Flat, Empak cst |
| 6101 |
1 |
Intrinsic Si:- |
[100] |
3" |
4,000 |
DSP |
FZ >8,000 |
Test, Scratched, 1Flat, Individual cst |
| 7185 |
1 |
Intrinsic Si:- |
[111] ±0.5° |
3" |
1,975 |
DSP |
FZ >20,000 |
Prime, 1Flat, Individual cst |
| D048 |
1 |
Intrinsic Si:- |
[111] ±0.5° |
3" |
1,975 |
DSP |
FZ >20,000 |
Test, NO Flats, Individual cst, Scratches on both sides |
| K056 |
3 |
p-type Si:B |
[100] |
3" |
5,000 |
SSP |
1-20 |
Prime, NO Flats, Individual cst |
| T206 |
8 |
p-type Si:B |
[100] |
3" |
3,050 ±50 |
C/C |
>0.5 |
1Flat, Individual cst (can be ordered singly) |
| 6949 |
8 |
p-type Si:B |
[111] |
3" |
2,300 |
DSP |
4-7 |
SEMI Prime, 1Flat, Individual cst |
| S5580 |
5 |
n-type Si:P |
[100] ±1° |
3" |
2,286 ±13 |
DSP |
15-28 |
SEMI Prime, 1Flat, TTV<1μm, Sealed in individual csts, in groups of 5 wafers |
| 6741 |
40 |
n-type Si:P |
[100] |
3" |
1,000 |
SSP |
1-20 |
SEMI Prime, 2Flats, Empak cst |
| 7307 |
5 |
n-type Si:P |
[100] |
3" |
5,000 |
SSP |
1-100 |
SEMI, 1Flat, Individual cst |
| 7821 |
50 |
n-type Si:P |
[100] |
3" |
5,000 |
SSP |
1-100 |
SEMI, 1Flat, Individual cst |
| 6308 |
8 |
n-type Si:P |
[100] |
3" |
6,000 |
SSP |
1-20 |
SEMI Prime, 1Flat, Individual cst< In sealed group of 8 wafers |
| S5921 |
2 |
n-type Si:P |
[100] |
3" |
7,620 ±100 |
SSP |
1-10 |
Test, NO Flats, Edge Chips Group of 2 wafers |
| 5721 |
29 |
n-type Si:P |
[111] ±0.5° |
3" |
1,500 |
DSP |
31-35 |
SEMI Prime, 1Flat, Empak cst, Cassettes of 10 + 10 + 9 wafers |
| 1263 |
5 |
n-type Si:P |
[111] ±0.5° |
3" |
1,400 |
SSP |
25-35 |
SEMI Prime, 1Flat, in single wafer cassettes, sealed in groups of 5 |
| H136 |
2 |
n-type Si:P |
[111] |
3" |
10,000 |
SSP |
20-60 |
SEMI Prime, 1Flat, Individual cst |
| 6198 |
5 |
n-type Si:P |
[111] |
3" |
3,000 |
SSP |
10-20 |
SEMI Prime, 2Flats, Individual cst, Groups of 2 + 3 wafers |
| E206 |
100 |
n-type Si:P |
[111-5° towards[110]] ±0.25° |
3" |
1,000 |
SSP |
>5 |
SEMI Prime, 1Flat, hard cst |
| G206 |
19 |
n-type Si:P |
[111-5° towards[110]] ±0.25° |
3" |
1,000 |
SSP |
>5 |
SEMI Prime, 1Flat, in hard cassettes of 6, 6 & 7 wafers |
| 1207 |
17 |
n-type Si:P |
[111-5° towards[110]] ±0.25° |
3" |
1,300 |
SSP |
>5 |
SEMI Prime, 1Flat, hard cst |
| S5804 |
25 |
n-type Si:P |
[111-0.5° towards[110]] ±0.25° |
3" |
1,400 |
E/E |
>5 |
SEMI, 1Flat, LaserMark, in opened hard cast |
| 7645 |
10 |
n-type Si:P |
[111] |
3" |
6,000 |
SSP |
5-10 |
SEMI Prime, 1Flat, Group of 10 wafers |
| F136 |
13 |
n-type Si:P |
[111] ±0.5° |
3" |
1,000 |
DSP |
0.5-2.0 |
SEMI Prime, 2Flats, Empak cst |
2" Wafers |
| Item |
Qty in |
Material |
Orient. |
Diam. |
Thck |
Surf. |
Resistivity |
Comment |
| Stock |
(μm) |
Ωcm |
| 7505 |
25 |
p-type Si:B |
[100] |
2" |
1,600 |
SSP |
FZ >3,000 |
SEMI Prime, 2Flats, Individual cst |
| U206 |
59 |
p-type Si:B |
[100] |
2" |
3,150±50 |
C/C |
>0.5 |
1Flat, Individual cst |
| 5918 |
11 |
p-type Si:B |
[100] |
2" |
3,000 |
SSP |
0.015-0.020 |
Groups of 5 + 6 wafers, Test, 2Flats, Individual cst, Wafers with defects |
| M405 |
25 |
p-type Si:B |
[111] |
2.5" |
10,000 |
C/C |
>1 |
NO Flats, As-Cut, no edge-rounding |
| G776 |
58 |
p-type Si:B |
[111] |
2" |
1,000 |
SSP |
0.001-0.005 |
SEMI Prime, 1Flat, hard cst |
| S5701 |
3 |
p-type Si:B |
[111] ±0.5° |
2" |
4,700 ±125 |
SSP |
0.001-100.000 |
Test, NO Flats, Unsealed in plastic box |
| 6563 |
6 |
n-type Si:P |
[100] |
2" |
3,175 |
SSP |
1-3 |
Prime, NO Flats, Individual cst |
| 4501 |
2 |
n-type Si:As |
[100] |
2" |
7,050 |
SSP |
0.0031-0.0038 |
SEMI Prime, 2Flats, Individual cst Group of 2 wafers |
| 4765 |
2 |
n-type Si:P |
[111] ±0.5° |
2" |
5,000 |
SSP |
>20 |
Prime, NO Flats, Individual cst, Group of 2 wafers |
| S5934 |
4 |
n-type Si:P |
[111] ±0.5° |
2" |
4,700 ±100 |
SSP |
1-100 |
SEMI Test, 1Flat, Unsealed, Scratched |
| 4878 |
1 |
n-type Si:P |
[111] ±0.5° |
2" |
6,000 |
SSP |
1-10 |
SEMI Prime, 1Flat, Individual cst |
| 4958 |
5 |
n-type Si:Sb |
[111] |
2" |
2,900 |
DSP |
0.013-0.015 |
Prime, NO Flats, Individual cst, Group of 5 wafers |
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1" Wafers |
| Item |
Qty in |
Material |
Orient. |
Diam. |
Thck |
Surf. |
Resistivity |
Comment |
| Stock |
(μm) |
Ωcm |
| 1978 |
13 |
Intrinsic Si:- |
[111] ±0.5° |
1" |
1,000 |
SSP |
FZ 14,000-30,000 |
NO Flats, Soft cst, Cassettes of 7, 6, 6 wafers |
| 4427 |
12 |
Intrinsic Si:- |
[111] ±2° |
1" |
27,870 ±100 |
C/C |
FZ >10,000 |
Single Crystal Silicon Rod, 0.39" diameter × 27.87±0.1mm |
| L678 |
13 |
p-type Si:B |
[100] |
1" |
3,000 |
SSP |
1-50 |
Prime, NO Flats, Individual cst, Group of 13 wafers |
| 6179 |
1 |
n-type Si:P |
[100] |
1" |
1,500 |
SSP |
1-20 |
Prime, NO Flats, Soft cst |
| 6446 |
1 |
Intrinsic Si:- |
[100] |
0.5" |
12,700 ±50 |
C/C |
FZ >10,000 |
NO Flats, a set of 4 rods sealed in polyehtylene foil |