Gallium Arsenide for Research and Production 

UniversityWafer supplies Gallium Arsenide (GaAs) wafers for semiconductor research, device development, and production applications. GaAs is a direct-bandgap III-V semiconductor valued for high electron mobility and strong optoelectronic performance, making it well suited for RF and microwave electronics, photonics, LEDs and lasers, solar cells, and high-speed devices. Choose from monocrystalline and polycrystalline GaAs substrates with a range of diameters, orientations, dopants, resistivities, thicknesses, and surface finishes.

UW Logo

Gallium Arsenide Wafer Specifications

UniversityWafer supplies Gallium Arsenide (GaAs) wafers for research, semiconductor processing, epitaxial growth, RF electronics, photonics, optoelectronics, and photovoltaic applications.

GaAs is a III-V compound semiconductor with a direct band gap of approximately 1.42 eV at room temperature. Its relatively high electron mobility and direct optical transition make it especially important for high-frequency electronics and light-emitting or light-detecting semiconductor devices.

Available GaAs Wafer Options

  • Crystal type: Monocrystalline and polycrystalline
  • Electrical type: n-type, p-type, semi-insulating, or nominally undoped
  • Orientations: Commonly (100), (110), (111), and selected off-axis orientations
  • Surface finishes: Polished, lapped, etched, or as-cut
  • Thickness: Multiple thicknesses depending on diameter and inventory
  • Dopants: Depending on the required conductivity and electrical properties
  • Quantities: Research quantities through larger project requirements

GaAs for Epitaxial Growth

High-quality single-crystal GaAs substrates are commonly used for MBE and MOVPE/MOCVD growth of III-V semiconductor layers and heterostructures.

Substrate orientation, surface preparation, electrical properties, and off-cut angle can all influence epitaxial growth, so these parameters should be selected according to the intended device structure and deposition process.

Common GaAs Applications

  • RF and microwave electronics
  • MMICs and high-frequency devices
  • Laser diodes and LEDs
  • Photodetectors and optical sensors
  • Integrated photonics
  • High-efficiency photovoltaic research
  • III-V epitaxy and heterostructure development
  • Semiconductor materials characterization

Request a GaAs Wafer Quote

Tell us the specifications required for your project. For the fastest quote, include the wafer diameter, orientation, thickness, conductivity type, dopant, resistivity or carrier concentration, surface finish, and quantity.

Get Your Gallium Arsenide Wafer Quote FAST!
Or, Buy GaAs Wafers Online and Start Researching Today!





Gallium Arsenide (GaAs) Wafers for Advanced Semiconductor Applications

Gallium arsenide (GaAs) is a III-V compound semiconductor valued for its direct band gap, high electron mobility, and high-frequency performance. At room temperature, GaAs has a direct band gap of approximately 1.42 eV, allowing efficient absorption and emission of light. These properties make GaAs an important substrate and semiconductor material for RF and microwave electronics, photonics, optoelectronics, laser diodes, LEDs, photodetectors, and high-efficiency photovoltaic devices.

UniversityWafer supplies monocrystalline and polycrystalline GaAs wafers for research, device development, epitaxial growth, process development, and specialized production requirements. Available specifications can include different wafer diameters, crystal orientations, thicknesses, electrical properties, dopants, and surface finishes.

Gallium arsenide GaAs wafers for RF, microwave, photonics, optoelectronics, solar cells, sensors and high-speed semiconductor applications

Why Use Gallium Arsenide?

GaAs offers several material properties that distinguish it from silicon for selected electronic and optoelectronic applications. Its direct band gap enables efficient light generation and absorption, while its relatively high electron mobility supports high-speed and high-frequency electronic devices.

GaAs also supports the growth of compound-semiconductor heterostructures used in devices such as HEMTs, HBTs, MMICs, semiconductor lasers, LEDs, and multijunction solar cells. Material selection should always be based on the device structure and required electrical, optical, crystallographic, and surface specifications.

Monocrystalline Gallium Arsenide Wafers

Monocrystalline GaAs consists of a continuous single-crystal lattice and is generally preferred when device performance depends strongly on crystallographic uniformity, carrier transport, epitaxial quality, or optical efficiency.

Depending on availability, GaAs substrates may be supplied as semi-insulating, n-type, p-type, or nominally undoped material. Common dopants can include silicon for n-type conductivity and zinc for p-type conductivity, while semi-insulating GaAs is commonly produced using compensation techniques to obtain high resistivity.

Common GaAs Crystal Orientations

GaAs wafers are commonly supplied in orientations such as (100), (110), and (111), including selected off-axis orientations. The appropriate orientation depends on the epitaxial process, surface chemistry, device architecture, and research requirements.

GaAs Surface Finishes

Available material may include as-cut, etched, lapped, or polished GaAs wafers. Polished surfaces are typically required when a smooth, low-defect surface is needed for epitaxial growth, lithography, thin-film deposition, or semiconductor device fabrication.

Monocrystalline Gallium Arsenide Inventory

The inventory below includes GaAs substrates with various diameters, thicknesses, orientations, electrical characteristics, dopants, and surface finishes. Inventory changes frequently, so please provide your required specifications for current availability and pricing.

When requesting a quote, include the desired diameter, orientation, thickness, conductivity type, resistivity or carrier concentration, dopant, surface finish, quantity, and application whenever possible.

Item Type Dia(mm) Thick (um) EPD Mobility CC Resistivity Ori Surface Type Note ExtraCol0 ExtraCol1 ExtraCol2 ExtraCol3
1F054 mono 50.8 370 5721 5073 2740 2375 (5,61-8,76)E17 4.86E-03 3.00E-03 2° →0-1-1;EJ lapped Si EJ
1F055 mono 50.8 620 24422 3814 3131 2189 2.32E+17 8.18E+17 8.51E-03 3.49E-03 100;US as cut/etched Si 15° towards twidth="64"011
1F055 mono 76.2 530 24422 3814 3131 2189 2,32E17 8,18E17 8.58E-03 3.49E-03 ;EJ lapped Si 10° towards twidth="64"111A
1F058 mono 76.2 560 ;EJ lapped Zn 2°towards twidth="64"110
1F062 mono 50.8 450 19082 21850 73 37 8,48E18-5,55E19 1.01E-02 4.13E-03 100 as cut/etched Zn 1 flat
1F1038 mono 50 350 100;EJ lapped Si
1F-1052 mono 100 740 7842 6388 5194 3808 2.18E+08 1.81E+08 100US lapped N 2°towards twidth="64"110
1F1058 mono 100 625 4869 5882 3185 2039 2.99E+17 8.03E+17 6.55E-03 3.82E-03 100; EJ polished Si
1F1058 mono 100 600 4869 5882 3185 2039 2.99E+17 8.03E+17 6.55E-03 3.82E-03 100; EJ polished Si
1F-1064 mono 100 640 29167 31945 166 89 4.70E+18 1.52E+19 8.03E-03 4.62E-03 111B as cut/etched Zn
1F-1064 mono 100 480 29167 31945 166 89 4.70E+18 1.52E+19 8.03E-03 4.62E-03 111B lapped Zn
1F-1064 mono 100 400 29167 31945 166 89 4.70E+18 1.52E+19 8.03E-03 4.62E-03 111B polished Zn
1F-1069 mono 50 300-320 100EJ lapped Si
1F533 mono 76.2 625 7166 6792 1.29E+08 1.28E+08 ;US polished undoped
1F-898 mono 76.2 810 3838 4174 2.30E+16 1.76E+17 6.99E-02 8.49E-03 100US lapped Te
1F-902 mono 76.2 850 3136 3922 1972 1.10E+18 2.88E-03 111A as cut/etched Si
1F-902 mono 76.2 625 3136 3922 1972 1.10E+18 2.88E-03 111A polished Si
2F022 mono 50.8 360 62000 500 2893 2057 (0,37-1,120E18 5.84E-03 2.71E-03 100;EJ polished Si
2F033 mono 50.8 430 9940 7600 3459 2288 8.40E+16 2.12E+17 2.17E-02 1.29E-02 100;EJ lapped Si
2F044 mono 76.2 530 7825 8949 99 151 3,75E18 4,62E18 1.67E-02 8.91E-03 100 lapped Zn 2°towards twidth="64"111 A
2F079 mono 100 540 2671 5.60E+17 4.20E-03 111; EJ polished Si
2F-1132 mono 25.4 450 100 polished N nwidth="64"flats
2F365 mono 50.8 430-440 7395 7800 267 232 7,24E16 - 2,81E17 3.20E-01 9.58E-02 100;US lapped Zn
2F365 mono 50.8 360 7395 7800 267 232 7,24E16 - 2,81E17 3.20E-01 9.58E-02 100;US polished Zn
2F366 mono 50.8 620 3546 3445 233 180 (2,3-8,03)E17 1.16E-01 4.01E-02 100EJ as cut/etched Zn 2°towards twidth="64"110
2F378 mono 50.8 520-530 12000 249 222 6,21E16 - 2,23E17 4.00E-01 1.25E-01 100;US lapped Zn
2F388 mono 50.8 570 25150 50000 6140 7052 7.50E+07 1.67E+07 EJ lapped undoped 4°towards twidth="64"110
2F777 mono 50.8 750 8931 11935 2467 1994 5,52E17-1,1E18 4.58E-03 2.66E-03 100;EJ as cut/etched Si
2F777 mono 50.8 560 2468 2304 5.52E+17 1.10E+18 4.58E-03 2.45E-03 100;EJ lapped Si
2F777 mono 50.8 520 8931 11935 2467 1994 5,52E17-1,1E18 4.58E-03 2.66E-03 100;EJ lapped Si
2F777 mono 76.2 515 8931 9840 2467 1994 5,52E17 1,17E18 4.58E-03 2.66E-03 100;US lapped Si
2F777 mono 76.2 450 8931 9840 2467 1994 5,52E17 1,17E18 4.58E-03 2.66E-03 100;US polished Si
2F870 mono 50.8 730 11890 14120 4446 2472 (5,4-6,8)E16 2.62E-02 3.74E-02 100EJ as cut/etched Si 0,8° towards twidth="64"110
2F870 mono 50.8 550 4446 2472 (5,4-6,8)E16 2.62E-02 3.74E-02 100EJ lapped Si 0,8° towards twidth="64"110
2F871 mono 50.8 700 10326 12989 2123 1784 (0,78-14,62)E17 3.01E-03 2.40E-03 100;EJ as cut/etched Si
3F023 mono 100 715-760 2.24E+05 1.10E+05 7189 7238 6.42E+07 3.03E+07 100;US lapped undoped 2°towards twidth="64"110
3F040 mono 76.2 470 9247 468 4024 2761 0,224E17 6,14E18 6.91E-02 3.69E-02 100; lapped Si 1 flat
3F051 mono 50.8 420 551 2207 2438 2074 (0,91-1,36)E18 2.82E-03 2.21E-03 100EJ lapped Si 2°towards twidth="64"110
3F051 mono 50.8 350 551 2207 2438 2074 9.10E+17 1.36E+18 2.82E-03 2.21E-03 100EJ polished Si 2°towards twidth="64"110
3F060 mono 76.2 750 17620 10449 107 34 4,09E18 2,88E19 1.41E-02 6.44E-03 ;EJ as cut/etched Zn 2°towards twidth="64"110
3F065 mono 50.8 620 8663 6687 2562 2181 (0,66-1,04)E18 3.73E-03 2.75E-03 100;EJ as cut/etched Si
3F068 mono 50.8 430 461 2635 2221 2125 9,4E17 - 1,34E18 2.98E-03 2.18E-03 2° →110;EJ lapped Si
3F-1017 mono 50.8 370 5464 5980 2345 2139 (1,04-1,11)E18 2.40E-03 2.82E-03 100; lapped Si 1 flat
3F-1034 mono 50 500 6239 6832 121 91 6.67E+18 1.53E+19 7.75E-03 4.51E-03 100EJ lapped Zn
3F105 mono 50.8 550 9930 10093 82 58 6,41E18 - 6,97E19 1.18E-02 4.90E-03 100;US as cut/etched Zn
3F105 mono 50.8 380 9930 10093 82 58 6,41E18 - 6,97E19 1.18E-02 4.90E-03 100;US lapped Zn
3F120 mono 50.8 350 O 351 435 (1-3,08)E17 2.40E-01 5.55E-02 100;EJ polished Zn
3F125 mono 50.8 440 21127 6010 7507 1.07E+08 1.22E+08 100EJ lapped undoped 0,5°towards twidth="64"111
3F125 mono 50.8 375 21127 6010 7507 1.07E+08 1.22E+08 100EJ polished undoped 0,5°towards twidth="64"111
3F214 mono 100 450 10600 13240 81 51 3,1E19 4,8E19 7.03E-03 2.94E-03 100;EJ polished Zn
3F296 mono 76.2 500 O 12000 16745 4847 79 8,15E16 3,68E16 1.58E-02 2.10E-02 100;EJ polished Si
3F313 mono 76.2 500 6900 4960 106 100 4,39E18 9,3E18 1.34E-02 6.74E-03 111B lapped Zn
3F316 mono 50.8 470 7430 8800 6200 7728 2.47E+07 2.07E+07 100US lapped undoped 3°towards twidth="64"011
3F316 mono 50.8 350 O 7430 8800 6200 7728 2.47E+07 2.07E+07 100US polished undoped 3°towards twidth="64"011
3F422 mono 50.8 520 9100 10642 6932 7200 2.31E+08 2.28E+08 100EJ lapped undoped 2°towards twidth="64"110
3F422 mono 50.8 400 9100 10642 6932 7200 2.31E+08 2.28E+08 100EJ polished undoped 2°towards twidth="64"110
3F543 mono 100 690 10000 14000 5416 5011 3.71E+08 5.31E+08 111B;EJ lapped undoped
3F543 mono 100 625 10000 14000 5416 5011 3.71E+08 5.31E+08 111B;EJ polished undoped
5F-48 mono 100 720-730 4155 5695 5978 5180 2.23E+08 1.61E+08 100US lapped N
5F-48 mono 100 625+/-25 O 4155 5695 5978 5180 2.23E+08 1.61E+08 100US polished N
5F-50 mono 50 280-300 4990 5190 1774 2769 3.13E+17 1.35E+18 2.62E-07 7.20E-07 100EJ lapped Si
6F15 mono 25 350 O 7222 7330 5502 4700 1.87E+08 2.67E+08 polished N
6F-15 mono 25 420 7222 7330 5502 4700 1.87E+08 2.67E+08 lapped N
6F19 mono 100 680 4380 4699 3229 1808 3,10E16 1,60E16 3.82E-02 1.32E-01 100; EJ lapped Si
6F19 mono 100 625 4380 4699 3229 1808 3,10E16 1,60E16 3.82E-02 1.32E-01 100; EJ polished Si
6F2 mono 76.2 625 O 12900 14765 5211 4429 2.24E+08 2.64E+08 100;EJ polished undoped
6F-21 mono 50.8 490 8070 7986 2116 1802 1.10E+17 2.43E+17 2.70E-02 1.43E-02 100EJ lapped Si
A1266 mono 50.8 730 71542 76500 162 62 2,99E18-1,95E19 1.28E-02 5.09E-03 100;EJ as cut/etched Zn
A-1266 mono 50.8 730 71547 76409 162 62 2.99E+18 1.95E+19 1.28E-02 5.09E-03 100EJ lapped Zn
A1289 mono 50.8 300 41997 59515 2707 2328 (1,13-1,34)E18 1.71E-03 2.36E-03 111B polished Si
A1315 mono 50.8 350 O 110090 99994 5155 608 7.00E+08 7.82E+08 111B polished undoped
A1462 mono 50.8 650 48900 56140 4885 2338 2,67E15-3,15E16 4.06E-02 2.07E-02 100;EJ as cut/etched Si
A1477 mono 50.8 480 63520 81100 137 109.6 3,5E18-1,08E19 1.00E-02 5.30E-03 111B lapped Zn
A1538 mono 76.2 920 110889 116956 5080 3834 3,16E16 - 1,7E17 3.90E-02 9.45E-03 100;EJ as cut/etched Te
A1538 mono 76.2 775 110889 116956 5080 3834 3,16E16 - 1,7E17 3.90E-02 9.45E-03 100;EJ polished Te
A1589 mono 50.8 490 59600 73000 100 88 4,9E18 - 1,15E19 1.26E-02 6.09E-03 111B lapped Zn
A-1646 mono 50.8 750 31480 52240 77 139 7.20E+18 7.70E+18 1.11E-02 5.80E-03 111B as cut/etched Zn
A-1646 mono 50.8 480 31480 52240 77 139 7.20E+18 7.70E+18 1.11E-02 5.80E-03 111B lapped Zn
A1656 mono 76.2 850 3648 9,8E16 - 4,38E17 3.90E+17 100;US lapped Te
A1656 mono 76.2 750 O 3648 9,8E16 - 4,38E17 3.90E+17 100;US polished Te
A1674 mono 76.2 970 5053 3778 1,42E16 8,90E16 8.65E-02 1.85E-02 100;US as cut/etched Te
A1674 mono 76.2 800 5053 3778 1,42E16 8,90E16 8.65E-02 1.85E-02 100;US lapped Te
A1674 mono 76.2 500 5053 3778 1,42E16 8,90E16 8.65E-02 1.85E-02 100;US polished Te
A1743 mono 50.8 770 110;EJ as cut/etched Zn
A1785 mono 76.2 750 O 100;US polished Te
A1793 mono 50.8 750 51200 79800 2865 1.86E+09 110;EJ as cut/etched undoped
A1793 mono 50.8 410 61900 78940 5100 2865 5.65E+08 1.86E+09 110;EJ lapped undoped
A1793 mono 50.8 580 51200 79800 2865 1.86E+09 110;EJ lapped undoped
A1793 mono 50.8 350 61900 78940 5100 2865 5.65E+08 1.86E+09 110;EJ polished undoped
A1837 mono 50.8 540 48790 52300 4010 3955 (2,27-2,31)E17 4.86E-03 6.84E-03 111B lapped Si
A-1837 mono 51.1 600 4010 3955 2.27E+17 2.31E+17 6.86E-03 6.84E-03 111B as cut/etched Si CW
A1986 mono 50.8 650 49166 79325 222 4.10E+06 211B polished undoped 45°
A250 mono 50.8 410-420 1.11E+05 4.50E+04 156 68 (1,22-8,92)E18 3.50E-04 1.02E-03 100;US lapped Zn
A276 mono 76.2 920 7.31E+04 1.41E+05 102 73 4,23E18 9,74E18 1.40E-04 8.76E-03 100 as cut/etched Zn 3°towards twidth="64"111 A
A282 mono 50.8 350 81374 163024 5860 5521 1.07E+08 2.06E+08 111 polished undoped
A293 mono 50.8 570 1.13E+05 7.81E+04 3290 2200 4,2E17 - 1,17E18 4.58E-03 2.51E-03 100;US lapped Si
A485 mono 76.2 640 62065 71444 5473 1.19E+08 111B; lapped undoped
A485 mono 76.2 575 62065 71444 5473 1.19E+08 111B; polished undoped
A801 mono 50.8 350;400 82000 5291 4789 4.06E+08 7.01E+08 111B polished undoped
A817 mono 76.2 690-715 84408 99719 6643 4631 1.80E+08 6.49E+08 111; lapped undoped
A817 mono 76.2 630 84408 99719 6643 4631 1.80E+08 6.49E+08 111; polished undoped
A819 mono 76.2 370 78063 93511 3368 3011 3,84E17 5,1E17 4.83E-03 4.06E-03 100;EJ polished Si
A-819 mono 76.2 400 78063 93511 3368 3011 3.84E+17 5.10E+17 4.83E-03 4.06E-03 100EJ polished Si
A-819 mono 76.2 400 O 78063 93511 3368 3011 3.84E+17 5.10E+17 4.83E-03 4.06E-03 100EJ polished Si
A918 mono 50.8 410 68445 130000 6778 4310 1.50E+08 7.15E+08 100;EJ lapped undoped
A918 mono 50.8 350 68445 130000 6778 4310 1.50E+08 7.15E+08 100;EJ polished undoped
O1083 mono 50.8 410 72823 83374 6375 2.19E+08 100;EJ lapped undoped
O1083 mono 50.8 350 72823 83374 6375 2.19E+08 100;EJ polished undoped
O1329 mono 50.8 410 55000 2575 2411 8,8E17 - 1,04E18 2.74E-03 2.47E-03 100;EJ lapped Si
O1375 mono 50.8 730 51642 64100 2154 1.22E+09 111A as cut/etched undoped
O1375 mono 50.8 560;430 64100 2154 1.22E+09 111A lapped undoped
O1375 mono 50.8 450 64100 2154 1.22E+09 111A polished undoped
O1384 mono 50.8 480;350 100 lapované lapped undoped 1 flat
O1391 mono 50 350 44823 49750 100 lapped Si 1 flat

Polycrystalline Gallium Arsenide Wafers

Polycrystalline gallium arsenide (poly-GaAs) is composed of multiple crystalline grains separated by grain boundaries. Those grain boundaries can introduce additional carrier scattering, trapping, and recombination compared with high-quality single-crystal GaAs.

Because of these effects, polycrystalline GaAs is generally not the preferred substrate for high-performance active devices that depend on very high carrier mobility or high-quality epitaxial interfaces. However, it can be useful for materials research, process development, thin-film studies, experimental devices, and applications where single-crystal substrate quality is not required.

GaAs Applications

RF and Microwave Electronics

Semi-insulating and conductive single-crystal GaAs substrates are widely used in high-frequency semiconductor technologies. GaAs-based device structures can be used in MMICs, HEMTs, MESFETs, HBTs, RF amplifiers, and microwave circuits. Its high electron mobility can support high-frequency operation, while semi-insulating substrates can help electrically isolate devices and circuit elements.

Photonics and Optoelectronics

Because GaAs has a direct band gap, it can efficiently participate in radiative electron-hole recombination. GaAs and related III-V heterostructures are therefore important in laser diodes, LEDs, optical emitters, photodetectors, and integrated photonic devices.

GaAs Solar Cells

Single-crystal GaAs is an important photovoltaic semiconductor because its direct band gap and strong optical absorption allow efficient solar-energy conversion using relatively thin active layers. GaAs is used in high-efficiency single-junction and multijunction solar-cell architectures, particularly where efficiency and power-to-weight ratio justify the higher material and fabrication costs.

Epitaxial Growth on GaAs

GaAs substrates are widely used for epitaxial growth of III-V semiconductor structures. Techniques such as molecular beam epitaxy (MBE) and metalorganic vapor-phase epitaxy (MOVPE/MOCVD) can be used to create compound-semiconductor layers and heterostructures for electronic and optoelectronic devices.

Monocrystalline vs. Polycrystalline GaAs

The appropriate material depends on the application. Single-crystal GaAs is generally selected for active electronic and optoelectronic devices, while polycrystalline GaAs can be appropriate for selected research and process-development applications where grain boundaries are acceptable.

Property Monocrystalline GaAs Polycrystalline GaAs
Crystal Structure Continuous single-crystal lattice Multiple crystalline grains separated by grain boundaries
Carrier Transport Generally supports higher and more uniform carrier mobility when crystal quality is high Grain boundaries can increase carrier scattering and reduce effective mobility
Carrier Recombination Can provide relatively low recombination when material quality and interfaces are well controlled Grain-boundary defects can introduce additional recombination pathways
Structural Defects Defect density depends on crystal-growth method, wafer quality, and processing Includes grain boundaries in addition to other possible crystal defects
Epitaxial Device Growth Preferred for high-quality epitaxial semiconductor structures Generally unsuitable when single-crystal epitaxial quality is required
RF / Microwave Devices Widely used for high-frequency active devices and MMIC substrates Generally not preferred for high-performance active RF devices because of grain-boundary effects
Lasers and LEDs Important substrate/material platform for III-V optoelectronic devices Primarily of research interest where grain-boundary effects can be tolerated or studied
Photovoltaics Used in high-efficiency GaAs and III-V multijunction photovoltaic technologies Can be investigated for thin-film and materials research but grain boundaries can reduce device performance
Research Use Device fabrication, epitaxy, photonics, RF electronics, photovoltaics and materials research Materials characterization, grain-boundary studies, process development and experimental applications
Material Selection Best when crystallographic uniformity and device performance are critical Useful when a polycrystalline structure is acceptable or specifically being studied

How to Specify a GaAs Wafer

When selecting a gallium arsenide wafer, consider the complete substrate specification rather than diameter alone. Important parameters can include:

  • Crystal form: monocrystalline or polycrystalline
  • Diameter: based on available inventory and process compatibility
  • Crystal orientation: such as (100), (110), or (111)
  • Off-cut: when required for a particular epitaxial or surface process
  • Thickness: based on handling and process requirements
  • Electrical type: n-type, p-type, semi-insulating, or nominally undoped
  • Dopant: depending on the required electrical properties
  • Resistivity or carrier concentration: when electrically specified
  • Surface finish: as-cut, etched, lapped, or polished
  • Quantity: research quantities through larger project requirements

Gallium Arsenide Wafers for Research and Device Development

UniversityWafer can help researchers and engineers source GaAs substrates for compound-semiconductor research, epitaxial growth, RF electronics, photonics, optoelectronics, photovoltaics, sensors, and materials characterization.

If your required specification is not shown in the inventory, send us your target diameter, orientation, thickness, electrical properties, surface finish, and quantity so we can check additional availability.