The ZBH-32 is a zero background sample holder made from high purity aluminum. It is designed to hold a flat sample of powder, such as a standard. The sample is placed on the holder and the holder is placed in the diffractometer. The diffractometer takes an X-ray beam and sends it through the sample, then measures the intensity of the beam after it passes through the sample. There are many different techniques used to measure X-ray beams, but one of the most common is the use of a CCD camera. A CCD camera uses a grid of pixels to measure intensity of light that hits each pixel. The image below shows an example of an X-ray diffraction pattern taken using a ZBH. The image above shows two peaks: one at 2θ = 0.6 and another at 2θ = 36.5°. These are caused by reflections from planes in the crystal structure of silicon (Si). These reflections are known as Bragg peaks and they are used to determine the structure of Si and other materials. The ZBH-32 was designed with a large flat surface area on which to place the samples, allowing for much better