(111) Silicon Wafer Orientation for Research & Production

Get Your (111) Oriented Silicon Wafers Quote FAST!

How Can You Tell if a Silicon Wafer's Orientation is (111)?

The easiest way is to take a hammer and nail to the wafer! Put the nail on the wafer's center. Hit the nail with the hammer. If the wafer breaks into four pieces, the the crystal orienation is (100). If the wafer shatters, then it's (111).

 

(111) Oriented Silicon Wafers in Stock

Please see below for just a short list of the (111) Silicon Substrates that we have in stock and ready to ship. If you don't see what you need then please email us your specs.

Dia (mm)	Type/Dopant	Type/Dopant	Thck (μm)	Polish	Resistivity Ωcm	Specs
6"	n-type Si:P	[111] ±0.5°	300 ±15	P/P	FZ >6,000	SEMI Prime, 1Flat (57.5mm), Lifetime>1,000μs, Empak cst
6"	n-type Si:P	[111] ±0.5°	300 ±15	P/P	FZ >6,000	SEMI Prime, 1Flat (57.5mm), Lifetime>1,000μs, Empak cst
6"	Intrinsic Si:-	[111] ±0.5°	750	E/E	FZ >10,000	SEMI notch, TEST (defects, cannot be polished out), Empak cst
6"	p-type Si:B	[111-4.0°] ±0.5°	625	P/E	4-15 {7.1-8.8}	SEMI Prime, 1 JEIDA Flat(47.5mm), Empak cst
6"	n-type Si:P	[111] ±0.5°	675	P/E	1-100	SEMI Prime, NO Flats, Empak cst
6"	Intrinsic Si:-	[111] ±0.5°	675	C/C	FZ >10,000	SEMI notch, Empak cst
5"	n-type Si:P	[111] ±0.1°	200 ±15	BROKEN	FZ >3,000	Broken L/L wafers, in 2 pieces
5"	n-type Si:P	[111]	300 ±15	P/E	FZ 1,000-3,000	SEMI Prime, in hard cassettes of 8 wafers
5"	n-type Si:Sb	[111-3.0°] ±0.5°	625	P/E	0.015-0.020 {0.0152-0.0185}	SEMI Prime, 2Flats, Empak cst
4"	p-type Si:B	[111] ±0.5°	400 ±15	P/E	FZ >20,000	SEMI Prime, 1Flat, Empak cst, TTV<5μm, Lifetime>1,000μs
4"	p-type Si:B	[111] ±0.5°	397	P/E	FZ 10,000-15,000	SEMI Prime, Backside ACID Etched, Empak cst
4"	n-type Si:P	[111] ±0.25°	675	P/E	FZ 10,000-20,000	SEMI TEST (Light scratches), 1Flat, Lifetime>1,000μs, Empak cst,
4"	n-type Si:P	[111] ±0.5°	500	P/E	FZ 10,000-15,000	SEMI Prime, 1Flat, Empak cst, TTV<5μm
4"	n-type Si:P	[111] ±0.5°	675	P/E	FZ >7,000	SEMI, 1Flat, in Empak, Lifetime>1,600μs
4"	n-type Si:P	[111] ±0.5°	675	P/E	FZ >7,000	SEMI TEST (Scratches, in Unsealed Empak cassette), 1Flat, Lifetime>1,600μs
4"	n-type Si:P	[111] ±0.5°	675	P/E	FZ >7,000	SEMI, 1Flat, Lifetime>1,600μs, in Empak cassettes of 6 and 8 wafers
4"	n-type Si:P	[111] ±0.5°	630	P/G	FZ >7,000	SEMI Prime, 1Flat, in Empak, Lifetime>1,000μs, Back-side Fine Ground
4"	n-type Si:P	[111] ±0.25°	675	P/E	FZ 7,000-10,000	SEMI Prime, 1Flat, in Empak, Lifetime>1,000μs, Light scratches
4"	n-type Si:P	[111] ±0.5°	150 ±10	BROKEN	FZ 5,000-10,000	Broken P/E wafers, in Empak
4"	n-type Si:P	[111] ±0.25°	675	P/E	FZ 5,000-7,000	SEMI Prime, 1Flat, in Empak, Lifetime>1,000μs
4"	n-type Si:P	[111] ±0.25°	675	P/E	FZ 5,000-7,000	SEMI TEST (light scratches), 1Flat, Lifetime>1,000μs, in Empak
4"	n-type Si:P	[111] ±0.5°	525	P/E	FZ >5,000	SEMI Prime, 1Flat, Lifetime>1,000μs, Empak cst
4"	n-type Si:P	[111-1° towards[110]] ±0.5°	525	P/E	FZ >5,000	SEMI TEST (scratches on back-side), 1Flat, Empak cst
4"	n-type Si:P	[111] ±0.25°	525	P/E	FZ 3,000-5,000	SEMI TEST (light scratches), 1Flat, Empak cst
4"	n-type Si:P	[111] ±0.25°	525	P/E	FZ 3,000-5,000	SEMI Prime, 1Flat, in Empak cassettes of 3, 3 & 4 wafers
4"	n-type Si:P	[111] ±0.5°	525	P/P	FZ >3,000	SEMI Prime, 2Flats, Lifetime>1,000μs, Empak cst
4"	n-type Si:P	[111] ±0.5°	525	P/P	FZ >3,000	SEMI Prime, 2Flats, Lifetime>1,000μs, in Empak cassettes of 5, & 10 wafers
4"	n-type Si:P	[111] ±0.5°	525	P/P	FZ >3,000	SEMI Prime, 1Flat (32.5mm)
4"	n-type Si:P	[111] ±0.5°	285 ±10	P/P	FZ 2,500-2,700	SEMI Prime, 2Flats, Empak cst
4"	n-type Si:P	[111] ±0.5°	290 ±10	P/P	FZ 2,500-3,500	SEMI TEST (Surface defects), 2Flats, Empak cst
4"	n-type Si:P	[111] ±1°	380	P/E	FZ 2,000-3,000	SEMI Prime, 1Flat, TTV<5μm, Lifetime>1,000μs, in Epak cassettes of 6 wafers
4"	n-type Si:P	[111] ±0.5°	525	P/E	FZ 1,500-3,000	SEMI Prime, 1Flat, in Empak, Lifetime>1,100μs
4"	n-type Si:P	[111] ±0.5°	525	P/E	FZ 430-550	SEMI Prime, 1Flat, Empak cst, TTV<7μm
4"	n-type Si:P	[111] ±0.5°	525	P/E	FZ 430-550	SEMI Prime, 1Flat, Empak cst, TTV<7μm
4"	n-type Si:P	[111] ±0.5°	500 ±13	E/E	FZ 6.03-7.37	SEMI, 2Flats
4"	Intrinsic Si:-	[111] ±0.5°	500	P/P	FZ >25,000	SEMI Prime, 1Flat, Empak cst
4"	Intrinsic Si:-	[111] ±0.5°	300	P/E	FZ 20,000-40,000	SEMI, 1Flat, TTV<5μm, Empak cst
4"	Intrinsic Si:-	[111] ±0.5°	500	P/E	FZ >20,000	SEMI Prime, 1Flat, Empak cst, Extra 3 free non-prime wafers included with 4 prime wafers
4"	Intrinsic Si:-	[111] ±0.5°	450	P/P	FZ >20,000	SEMI Prime, 1Flat, Empak cst
4"	Intrinsic Si:-	[111] ±0.5°	500	P/P	FZ >10,000	SEMI Prime, 1Flat, Empak cst
4"	p-type Si:B	[111]	350	P/E	2-3	Prime, NO Flats, Empak cst
4"	p-type Si:B	[111] ±0.5°	1,000	P/E	1-10	SEMI Prime, 1Flat, in hard cassettes of 7 & 8 wafers
4"	p-type Si:B	[111]	1,000	P/P	1-10	SEMI Prime, 1Flat, Empak cst, Cassettes of 10 and 10 wafers
4"	p-type Si:B	[111]	1,000	P/P	1-10	SEMI Prime, 1Flat, Empak cst
4"	p-type Si:B	[111] ±0.5°	525	P/P	0.2-1.0	SEMI Prime, 1Flat, in Empak cassettes of 6, 7 & 7 wafers
4"	p-type Si:B	[111-4°] ±0.5°	525	P/E	0.01-0.02	SEMI Prime, 1Flat, Empak cst
4"	p-type Si:B	[111-4°] ±0.5°	525 ±15	P/EOx	0.005-0.015 {0.0086-0.0135}	SEMI Prime, 1Flat, Empak cst, TTV<5μm, 5,000A LTO on back-side
4"	p-type Si:B	[111-3°] ±0.5°	525	P/E	0.002-0.016	SEMI Prime, 1Flat, in Empak cassettes of 4, 5 & 5 wafers
4"	p-type Si:B	[111-3°]	525	P/E	0.002-0.004	SEMI Prime, 1Flat, Empak cst
4"	ShowShoppingCartTally(); p-type Si:B	[111] ±0.5°	1,000	P/E	<0.01	SEMI Prime, 1Flat, Empak cst